Sven-Peter Heyn

Title: Sven-Peter Heyn: Innovator in Optical Trapping Technology

Introduction

Sven-Peter Heyn is a notable inventor based in Berlin, Germany. He has made significant contributions to the field of optical trapping technology. His innovative work focuses on methods and apparatuses that enhance the investigation of samples using advanced microscopy techniques.

Latest Patents

Sven-Peter Heyn holds a patent for a "Method and apparatus for characterizing a sample with two or more optical traps." This invention relates to a method for investigating a sample using scanning probe photon microscopy or optical force microscopy. The apparatus is designed to utilize two optical traps that can be moved within a local region of the sample. In at least one of these traps, a probe is held. The method allows for the scanning of the sample using both traps, capturing and evaluating the measured data separately through correlation. Notably, the method can eliminate interference signals resulting from the interaction between the sample and the light trap.

Career Highlights

Sven-Peter Heyn is associated with JPK Instruments AG, a company known for its cutting-edge scientific instruments. His work at the company has been pivotal in advancing the capabilities of optical microscopy.

Collaborations

Sven-Peter has collaborated with esteemed colleagues such as Jacob Kerssemakers and Detlef Knebel. Their combined expertise has contributed to the development of innovative solutions in the field of microscopy.

Conclusion

Sven-Peter Heyn's contributions to optical trapping technology exemplify the impact of innovative thinking in scientific research. His patent and work at JPK Instruments AG highlight the importance of collaboration and advancement in microscopy techniques.