The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2013
Filed:
May. 30, 2008
Sven-peter Heyn, Berlin, DE;
Jacob Kerssemakers, Amsterdam, NL;
Detlef Knebel, Berlin, DE;
Helge Eggert, Berlin, DE;
Torsten Jaehnke, Berlin, DE;
Joern Kamps, Berlin, DE;
Sven-Peter Heyn, Berlin, DE;
Jacob Kerssemakers, Amsterdam, NL;
Detlef Knebel, Berlin, DE;
Helge Eggert, Berlin, DE;
Torsten Jaehnke, Berlin, DE;
Joern Kamps, Berlin, DE;
JPK Instruments AG, Berlin, DE;
Abstract
The present invention relates to a method for investigating a sample using scanning probe photon microscopy or optical force microscopy, and to an apparatus which is designed accordingly. The method or the apparatus provides for two optical traps which can be moved in a local region of the sample, wherein in at least one of the two traps a probe is held. The sample is scanned using the two traps and the measured data from the two traps are captured separately and evaluated by correlation. In particular interference signals resulting from an interaction between sample and light trap can be eliminated by the method.