Company Filing History:
Years Active: 2013
Title: Joern Kamps: Innovator in Optical Force Microscopy
Introduction
Joern Kamps is a notable inventor based in Berlin, Germany. He has made significant contributions to the field of optical force microscopy, particularly through his innovative methods and apparatuses. His work focuses on enhancing the capabilities of scanning probe photon microscopy.
Latest Patents
Joern Kamps holds a patent for a "Method and apparatus for characterizing a sample with two or more optical traps." This invention relates to a method for investigating a sample using scanning probe photon microscopy or optical force microscopy. The apparatus is designed to utilize two optical traps that can be moved within a local region of the sample. In at least one of these traps, a probe is held. The method allows for the scanning of the sample using the two traps, capturing measured data separately, and evaluating it by correlation. Notably, the method can eliminate interference signals resulting from the interaction between the sample and the light trap.
Career Highlights
Joern Kamps is associated with JPK Instruments AG, a company known for its advanced scientific instruments. His work at JPK Instruments AG has positioned him as a key figure in the development of innovative microscopy techniques.
Collaborations
He collaborates with talented individuals such as Sven-Peter Heyn and Jacob Kerssemakers, contributing to the advancement of research in optical microscopy.
Conclusion
Joern Kamps is a distinguished inventor whose work in optical force microscopy has led to significant advancements in the field. His innovative patent demonstrates his commitment to enhancing scientific research methodologies.