The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2007

Filed:

May. 17, 2002
Applicants:

Detlef Knebel, Berlin, DE;

Matthias Amrein, Calgary, CA;

Inventors:

Detlef Knebel, Berlin, DE;

Matthias Amrein, Calgary, CA;

Assignee:

JPK Instruments AG, Berlin, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 13/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to a method of and an apparatus for studying properties, especially physical properties of a surfactant. A fluid is introduced in the form of a sample volume in another fluid which is immiscible with said fluid so that an interface is formed between the one fluid and the other fluid, at least in a partial area of a surface of the sample volume. The sample volume is configured so as to be axially symmetrical around a given defining axis, whereby the interface is formed axially symmetrically with respect to the given defining axis. The surfactant is spread across the interface to form a surface film in the area of the interface with the surfactant. Thereupon the surface film can by studied microscopically.


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