The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2011
Filed:
Jan. 16, 2009
Torsten Jähnke, Berlin, DE;
Torsten Müller, Berlin, DE;
Detlef Knebel, Berlin, DE;
Kathryn Poole, Berlin, DE;
Torsten Jähnke, Berlin, DE;
Torsten Müller, Berlin, DE;
Detlef Knebel, Berlin, DE;
Kathryn Poole, Berlin, DE;
JPK Instruments AG, Berlin, DE;
Abstract
The present invention relates to a method for providing a measuring probe () for a probe microscopic examination of a sample in a probe microscope, in particular a scanning probe microscope, in which the measuring probe (), which has a probe base () and a probe extension () formed thereon, is held on a carrier device and the measuring probe () is processed before or after a measurement by detaching a section of the probe extension (). The invention further relates to an arrangement having a probe microscope for the probe microscopic examination of a sample, in particular a scanning probe microscope.