This inventor holds 10 USPTO granted patents and 1 published patent application. Top assignees: Jpk Instruments Ag, Bruker Nano Gmbh. Active years: 2006-2020.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Lychen, DE (2011 - 2014)
- Berlin, DE (2006 - 2020)
Company Filing History:
Years Active: 2006-2020
Title: Inventor Torsten Jähnke: A Pioneer in Scanning Probe Microscopy
Introduction
Torsten Jähnke is a renowned inventor based in Berlin, Germany. With an impressive portfolio of 10 patents, he has focused his work on advancing scanning probe microscopy technology. His innovative contributions significantly impact research and technology in various scientific fields.
Latest Patents
Torsten Jähnke's latest patents include a measuring device for a scanning probe microscope and a method for operating the scanning probe microscope. The measuring device features a measuring probe arranged on a first probe holding device, a detection device equipped with a measurement light source, and a sensor that captures light beams reflected from the measuring probe. This innovative setup allows for varying optical beam paths, improving measurement efficacy. Additionally, Jähnke has developed an apparatus for investigating samples through multiple investigation methods, which incorporates both first and second optical beam paths for enhanced measurement capabilities.
Career Highlights
Throughout his career, Jähnke has worked with notable companies, including JPK Instruments AG and Bruker Nano GmbH. His roles in these organizations have allowed him to collaborate on cutting-edge research and development projects, augmenting his expertise in the field of microscopy.
Collaborations
Jähnke has had the pleasure of working alongside talented individuals, including Detlef Knebel and Torsten Müller. Their collaborative efforts have contributed to advancements in instrumental designs and methodologies within the realm of optical and scanning probe technologies.
Conclusion
With a notable career marked by innovative patents and fruitful collaborations, Torsten Jähnke continues to solidify his position as a pioneering inventor. His contributions to the field of scanning probe microscopy not only highlight his expertise but also enhance scientific discovery across various research disciplines.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile