Cary, NC, United States of America

Jmp Statistical Discovery LLC

Calculating rank
USPTO Granted Patents = 20

Forward Citations = 11

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21 inventors (with patents filed for the assignee):

goldMedal Ryan Adam Lekivetz (15 out of 34 patents)

silverMedal Joseph Albert Morgan (12 out of 31 patents)

bronzeMedal Jacob Davis Rhyne (12 out of 14 patents)

4.  Caleb Bridges King (10 out of 22 patents)

5.  Bradley Allen Jones (8 out of 26 patents)

6.  Mark Wallace Bailey (5 out of 7 patents)

7.  Peng Liu (4 out of 7 patents)

8.  Rajneesh Rajneesh (3 out of 3 patents)

9.  Yeng Saanchi (2 out of 3 patents)

10.  Laura Castro-Schilo (1 out of 2 patents)

11.  John Sall (1 out of 1 patent)

12.  Anne Laurene Dudley (1 out of 1 patent)

13.  Michael Dale Anderson (1 out of 2 patents)

14.  Byron Asa Wingerd (1 out of 1 patent)

15.  Mary Loveless (1 out of 1 patent)


20 patents:

Company Overview
Jmp Statistical Discovery LLC, based in Cary, NC, specializes in advanced statistical software solutions designed to facilitate data analysis and visualization. The company focuses on empowering users to uncover insights through innovative tools that cater to a wide range of industries, including healthcare, finance, and manufacturing. Jmp's technology emphasizes user-friendly interfaces and robust analytical capabilities, enabling organizations to make data-driven decisions effectively and efficiently.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 27 2026

20 Patents

#10 in Cary, NC

#370 in North Carolina

#16,416 in US

#31,315 in the World

Cary, NC (US)
Cary, NC, United States of America
Forward Citations = 11

21 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Jmp Statistical Discovery LLC. Retrieved from https://idiyas.com/company/jmp-statistical-discovery

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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