The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 26, 2023
Filed:
Jun. 27, 2023
Jmp Statistical Discovery Llc, Cary, NC (US);
Caleb Bridges King, Morrisville, NC (US);
Ryan Adam Lekivetz, Cary, NC (US);
Joseph Albert Morgan, Raleigh, NC (US);
Yeng Saanchi, Raleigh, NC (US);
Bradley Allen Jones, Cary, NC (US);
JMP Statistical Discovery LLC, Cary, NC (US);
Abstract
A computing device receives a target value for a design quality metric. The target value indicates a desired quality of a design of an experiment and is related to an input parameter by a response curve. The computing device also validates the target value as being in a feasibility range for the design quality metric, and if so, determines a candidate value for the input parameter that yields a calculated value for the design quality metric. To determine the calculated value, the computing device iteratively adjusts the candidate value until the calculated value is within a predetermined tolerance of the target value. The computing device then updates an interactive graph visually representing the calculated value for the design quality metric as a function of the candidate value for the input parameter and outputs a graph visually representing the relationship that exists between the candidate value and the calculated value.