The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2025

Filed:

Jan. 24, 2024
Applicant:

Jmp Statistical Discovery Llc, Cary, NC (US);

Inventors:

Jacob Davis Rhyne, Dallas, NC (US);

Mark Wallace Bailey, Haddonfield, NJ (US);

Ryan Adam Lekivetz, Cary, NC (US);

Peng Liu, Naperville, IL (US);

Joseph Albert Morgan, Raleigh, NC (US);

Laura Castro-Schilo, Chapel Hill, NC (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2018.01); G06F 11/3668 (2025.01); G06F 11/3698 (2025.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01); G06F 11/3698 (2025.01);
Abstract

A system, method, and computer-program product includes obtaining application configuration data; computing, via an execution of a designed experiment, a plurality of application usability tests based on the application configuration data; generating a computer-executable application based at least on the plurality of application usability tests; and deploying the computer-executable application to a target computing environment for execution by one or more users.


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