The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2026
Filed:
Dec. 04, 2024
Jmp Statistical Discovery Llc, Cary, NC (US);
William Smith Fisher, Seneca, SC (US);
Jacob Davis Rhyne, Dallas, NC (US);
Mark Wallace Bailey, Haddonfield, NJ (US);
Joseph Albert Morgan, Raleigh, NC (US);
Ryan Adam Lekivetz, Cary, NC (US);
JMP STATISTICAL DISCOVERY LLC, Cary, NC (US);
Abstract
A computing system obtains multiple factors for a first environment in a first experiment. The multiple factors include one or more profile factors and one or more subject factors. Each profile factor of the one or more profile factors specifies multiple candidate features for the first environment. Each subject factor of the one or more subject factors specifies multiple candidate levels categorizing different subjects interacting with the first environment. The computing system obtains a predictive model for predicting probabilities of multiple candidate outcomes for the first environment. The predictive model has weighted model terms. The computing system receives a selection of a first level for a first subject factor of the one or more subject factors. The computing system generates a computer-generated representation of a fixed-factor model. The fixed-factor model predicts multiple candidate outcomes for a second environment with subjects defined by the selection of the first level.