The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2024
Filed:
Jul. 11, 2024
Jmp Statistical Discovery Llc, Cary, NC (US);
Ryan Adam Lekivetz, Cary, NC (US);
Jacob Davis Rhyne, Dallas, NC (US);
Joseph Albert Morgan, Raleigh, NC (US);
JMP STATISTICAL DISCOVERY LLC, Cary, NC (US);
Abstract
A computing device receives a request requesting a screening design for an experiment. The device obtains, for the screening design, factors for screening in the experiment. A first factor is a categorical factor with a first set of candidate inputs comprising at least three candidate inputs in the experiment. A second factor is a continuous factor with a second set of candidate inputs comprising candidate input options within range(s) for the second factor. The device receives an indication of a run size that is a user-requested quantity of runs for the screening design. The device generates the screening design based on the run size. The device outputs the screening design. The screening design comprises runs of a quantity based on the user-requested quantity of runs for the screening design. The runs comprise the first set of candidate inputs and at least three inputs of the second set of candidate inputs.