The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 2024
Filed:
Jul. 11, 2024
Jmp Statistical Discovery Llc, Cary, NC (US);
Ryan Adam Lekivetz, Cary, NC (US);
Bradley Allen Jones, Cary, NC (US);
Jacob Davis Rhyne, Dallas, NC (US);
Joseph Albert Morgan, Raleigh, NC (US);
JMP STATISTICAL DISCOVERY LLC, Cary, NC (US);
Abstract
A computing device receives a request requesting a screening design for an experiment. The device obtains factors for screening. A first factor has a first set of candidate inputs comprising at least two candidate inputs for allowable inputs in the experiment. A second factor has a second set of candidate inputs comprising at least three candidate inputs for allowable inputs in the experiment. The device receives an indication of a run size. The device generates the screening design by assigning, based on the run size, the first factor to a two-level group that only allows at most two allowable inputs for the first factor in the experiment. The device generates the screening design by assigning, based on the initial run size, the second factor to a three-level group that only allows at most three allowable inputs for the second factor in the experiment. The device outputs the screening design.