The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2026
Filed:
Sep. 09, 2025
Jmp Statistical Discovery Llc, Cary, NC (US);
Ryan Adam Lekivetz, Cary, NC (US);
Joseph Albert Morgan, Raleigh, NC (US);
Jacob Davis Rhyne, Dallas, NC (US);
JMP Statistical Discovery LLC, Cary, NC (US);
Abstract
An apparatus includes a processor to: present a prompt to select a first pathway to traverse from among a set including a test-focused pathway of initial test-related parameter prompts followed by subsequent prompts for model-related or term-related parameters, a model-focused pathway of initial model-related parameter prompts followed by subsequent prompts for test-related or term-related parameters, and a term-focused pathway of initial term-related parameter prompts followed by subsequent prompts for test-related or model-related parameters; traverse the first pathway by presenting the initial prompts followed by the subsequent prompts of the first pathway, and receiving initial or subsequent parameter value(s); present a prompt to select a second pathway, different from the first pathway, to traverse from among the set; and traverse the second pathway by presenting the initial prompts followed by the subsequent prompts of the second pathway, and receiving initial or subsequent parameter value(s).