Chapel Hill, NC, United States of America

Anne Laurene Dudley

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Jmp Statistical Discovery LLC. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Anne Laurene Dudley. Retrieved from https://idiyas.com/inventor/anne-laurene-dudley

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Anne Laurene Dudley

Introduction

Anne Laurene Dudley is a notable inventor based in Chapel Hill, NC (US). She has made significant contributions to the field of statistical analysis through her innovative work. Her expertise lies in developing systems and methods that enhance the usability of control charts in data analysis.

Latest Patents

Dudley holds a patent for "Systems, methods, and graphical user interfaces for generating short run control charts." This invention includes a system, method, and computer-program product that allows users to create short run control charts from datasets. The user interface is designed to detect drag-and-drop inputs, converting values from a dataset into location data points. Additionally, it updates a real-time view of the short run control chart to include these data points, making data visualization more intuitive and efficient.

Career Highlights

Dudley is associated with Jmp Statistical Discovery LLC, where she applies her skills in statistical discovery and data analysis. Her work has been instrumental in advancing the capabilities of statistical software, particularly in the area of control chart generation.

Conclusion

Anne Laurene Dudley's contributions to the field of statistical analysis through her innovative patent demonstrate her commitment to enhancing data visualization and usability. Her work continues to impact the way data is analyzed and interpreted in various industries.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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