Company Badge
USPTO Data Jan 1 1976 - Oct 13 2026
10 Patents
#240 in Hsinchu
#1,426 in Taiwan
#56,047 in the World
Hermes Testing Solutions Inc.
Forward Citations = 1
15 inventors:
Hermes Testing Solutions Inc.
% Expired Patents = 10.0
Forward Citations = 1
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15 inventors (with patents filed for the assignee):
Wen-Yuan Hsu (5 out of 7 patents)
Bo-Lung Chen (3 out of 3 patents)
Chi-Ming Yang (2 out of 139 patents)
4. Sih-Ying Chang (2 out of 2 patents)
5. Chun-hsiung Chou (1 out of 3 patents)
6. Chien-Yao Hung (1 out of 8 patents)
7. Ming-Hsien Chen (1 out of 9 patents)
8. Tsung-Po Lee (1 out of 1 patent)
9. Kee-Leong Yu (1 out of 1 patent)
10. Shih-ying Chou (1 out of 1 patent)
11. Chiao-Pei Chen (1 out of 1 patent)
12. Wei-Ting Chen (1 out of 1 patent)
13. Tzu-Chien Wang (1 out of 1 patent)
14. Jia-Lin Lu (1 out of 1 patent)
15. Yi-Chun Yang (1 out of 1 patent)
10 patents:
Company Overview
Hermes Testing Solutions Inc. is a technology company based in Hsinchu, Taiwan, specializing in advanced testing solutions for the semiconductor and electronics industries. The organization focuses on developing innovative methodologies and tools that enhance the reliability and performance of electronic components. With a commitment to quality and precision, Hermes Testing Solutions plays a crucial role in supporting the evolving demands of technology, ensuring that products meet rigorous industry standards and customer expectations.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Hermes Testing Solutions Inc.. Retrieved from https://idiyas.com/company/hermes-testing-solutions
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]