Sih-Ying Chang

Title: Sih-Ying Chang: Innovator in Testing Solutions

Introduction

Sih-Ying Chang is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of testing solutions, particularly in the development of innovative devices that enhance the efficiency and effectiveness of testing processes.

Latest Patents

Sih-Ying Chang holds 2 patents that showcase his inventive prowess. His latest patents include an "Adjustable Supporting Device" and a "Probing System for Discrete Wafer." The adjustable supporting device is designed to support a test circuit module, featuring a complex arrangement of components that ensure optimal parallelism and horizontal flatness during testing. The probing system utilizes a suction nozzle to enhance the probing process, allowing for adjustable distances between the nozzle and probes, thereby extending the system's usage life.

Career Highlights

Sih-Ying Chang is currently employed at Hermes Testing Solutions Inc., where he continues to innovate and develop advanced testing technologies. His work has significantly impacted the efficiency of testing procedures in the semiconductor industry.

Collaborations

Throughout his career, Sih-Ying has collaborated with talented individuals such as Wen-Yuan Hsu and Chi-Ming Yang. These collaborations have fostered a creative environment that encourages the development of cutting-edge solutions in testing technology.

Conclusion

Sih-Ying Chang's contributions to the field of testing solutions exemplify his dedication to innovation and excellence. His patents reflect a deep understanding of the complexities involved in testing processes, making him a valuable asset to the industry.