The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2026
Filed:
Sep. 19, 2023
Applicant:
Hermes Testing Solutions Inc., Hsinchu City, TW;
Inventor:
Chi-Ming Yang, Hsinchu City, TW;
Assignee:
HERMES TESTING SOLUTIONS INC., Hsinchu City, TW;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K 7/18 (2006.01); G01K 1/02 (2021.01); G01K 1/16 (2006.01); H10P 72/00 (2026.01); H10P 74/00 (2026.01);
U.S. Cl.
CPC ...
G01K 7/18 (2013.01); G01K 1/026 (2013.01); G01K 1/16 (2013.01); H10P 72/00 (2026.01); H10P 74/00 (2026.01);
Abstract
A temperature detection system including a wafer, a plurality of sensing modules, and a probe is provided. The wafer has a plurality of dies. The sensing modules are adjacent to the dies, and each of the sensing modules includes a temperature sensor and a plurality of pads. The pads are electrically connected to the temperature sensor. The sensing modules transmit detection signals through the probe.