Chien-Yao Hung

Title: Chien-Yao Hung: A Visionary in Probe Card Innovations

Introduction

Chien-Yao Hung, an inventive talent based in Hsin-Chu, Taiwan, has made significant contributions to the field of electronic testing through his innovative designs and solutions. With a remarkable portfolio of 8 patents, Hung stands out as a prominent figure in the realm of probe card structures and testing technologies. His work is instrumental in enhancing the reliability and efficiency of semiconductor testing processes.

Latest Patents

Among his most notable inventions is a sophisticated probe card structure designed for 3D integrated circuit (IC) testing. This invention features a printed circuit board with a unique first through hole and a center stiffener that accommodates additional components. The first and second probe head modules are strategically arranged, integrating multiple probe pins to facilitate efficient testing of complex semiconductor devices.

Another significant patent from Hung is the development of a probe card dedicated to testing wafers with fine pitch circuits. This invention includes a testing PCB, a precision probe head, and a silicon interposer substrate that ensure optimal signal conveyance between the probes and the testing hardware. The design, which utilizes a through-silicon via semiconductor fabrication process, demonstrates Hung's commitment to advancing technology within the industry.

Career Highlights

Chien-Yao Hung has had the opportunity to collaborate with leading organizations in the field. Notably, he worked with Hermes-Epitek Corporation and Hermes Testing Solutions Inc., where he leveraged his expertise to drive innovation in electronic testing solutions. Throughout his career, his work has been pivotal in crafting advanced technologies that cater to the evolving needs of the semiconductor testing landscape.

Collaborations

During his journey, Hung has collaborated with other esteemed professionals, including Chih Yao Chen and Chih-Yao Chen. These partnerships have helped foster an environment of shared knowledge and innovation, allowing for the development of cutting-edge technologies in probe card applications. Such collaborations emphasize the importance of teamwork in achieving breakthroughs within the industry.

Conclusion

Chien-Yao Hung's impressive track record of patents and collaborations speaks volumes about his dedication to innovation in the semiconductor testing field. As technologies continue to advance, his contributions to probe card structures and testing solutions will undoubtedly influence future developments in electronic testing and integrated circuits. His work not only enhances efficiency but also sets the stage for the next generation of innovations in this crucial sector.