Hsinchu, Taiwan

Tzu-Chien Wang

This inventor holds 1 USPTO granted patent. Top assignee: Hermes Testing Solutions Inc.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tzu-Chien Wang. Retrieved from https://idiyas.com/inventor/tzu-chien-wang-5feft4qu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Tzu-Chien Wang: Innovator in Probe Card Technology

Introduction

Tzu-Chien Wang is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of probe card technology, which is essential in the semiconductor industry. His innovative approach has led to the development of a unique patent that simplifies the assembly and disassembly of probe cards.

Latest Patents

Tzu-Chien Wang holds a patent for a probe card that features a module cap designed with a chute. This innovative design allows the probe module to be easily installed or uninstalled from the module cap via the chute. This advancement not only simplifies the operations involved but also minimizes the risk of positioning errors during the process.

Career Highlights

Wang is currently employed at Hermes Testing Solutions Inc., where he continues to work on advancements in testing solutions for the semiconductor industry. His expertise and innovative mindset have positioned him as a valuable asset to the company.

Collaborations

Tzu-Chien Wang collaborates with talented individuals such as Wen-Yuan Hsu and Ming-Hsien Chen. Their combined efforts contribute to the ongoing development of cutting-edge technologies in their field.

Conclusion

Tzu-Chien Wang's contributions to probe card technology exemplify the spirit of innovation in the semiconductor industry. His patent and work at Hermes Testing Solutions Inc. highlight his commitment to improving testing solutions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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