The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2024
Filed:
Mar. 09, 2022
Applicant:
Hermes Testing Solutions Inc., Hsinchu, TW;
Inventors:
Chiao-Pei Chen, Hsinchu, TW;
Chun-Hsiung Chou, Hsinchu, TW;
Assignee:
HERMES TESTING SOLUTIONS INC., Hsinchu, TW;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05K 3/46 (2006.01); G01R 1/073 (2006.01); H05K 1/02 (2006.01);
U.S. Cl.
CPC ...
H05K 3/462 (2013.01); G01R 1/07307 (2013.01); H05K 1/0284 (2013.01); H05K 2203/016 (2013.01);
Abstract
A testing substrate includes a first build-up structure and a ceramic substrate. The ceramic substrate is arranged on the first build-up structure. The first bonding interface between the first build-up structure and the ceramic substrate includes a dielectric-to-dielectric bonding interface and a metal-to-metal bonding interface. A manufacturing method of a testing substrate and a probe card are also provided.