For the Inventor, By the Inventor

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Beaverton, OR, United States of America

Cascade Microtech, Inc.

USPTO Granted Patents = 248

EPO Patents = 8

Trademarks = 14

Forward Citations = 6,950

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118 inventors (with patents filed for the assignee):

Kenneth R Smith (47 out of 54 patents)

K Reed Gleason (44 out of 46 patents)

Paul A Tervo (40 out of 42 patents)

4. Eric W Strid (37 out of 39 patents)

5. John L Dunklee (36 out of 48 patents)

6. Leonard A Hayden (32 out of 33 patents)

7. Mike Andrews (27 out of 28 patents)

8. Warren K Harwood (25 out of 27 patents)

9. Randy J Schwindt (25 out of 28 patents)

10. Martin J Koxxy (24 out of 24 patents)

11. Clarence E Cowan (23 out of 25 patents)

12. John T Martin (22 out of 29 patents)

13. Timothy E Lesher (15 out of 15 patents)

14. Tim Lesher (14 out of 16 patents)

15. Reed Gleason (13 out of 13 patents)

Core Competencies:

Probe Head Assemblies

Wafer-Handling End Effectors

Resilient Electrical Interposers

High Voltage Chuck

Optically Enhanced Digital Imaging

Modular Prober

EMI Shielding

Low Noise Connectors

Double Sided Probing Structures

Thermal Conditionable Prober

High Frequency Interconnect Structures

Probing Apparatus

248 patents: Sort by Forward Citations

1. 9991152 - Wafer-handling end effectors with wafer-contacting surfaces and sealing structures (2018-06-05),

2. 9989558 - Probe head assemblies, components thereof, test systems including the same, and methods of operating the same (2018-06-05),

3. 9983232 - Prober for testing devices in a repeat structure on a substrate (2018-05-29),

4. 9874585 - Resilient electrical interposers, systems that include the interposers, and methods for using and forming the same (2018-01-23),

5. 9804196 - Probes with fiducial marks, probe systems including the same, and associated methods (2017-10-31),

6. 9784763 - Shielded probe systems with controlled testing environments (2017-10-10),

7. 9741599 - High voltage chuck for a probe station (2017-08-22),

8. 9506973 - High voltage chuck for a probe station (2016-11-29),

9. 9470753 - Systems and methods for testing electronic devices that include low power output drivers (2016-10-18),

10. 9435858 - Focusing optical systems and methods for testing semiconductors (2016-09-06),

11. 9429638 - Method of replacing an existing contact of a wafer probing assembly (2016-08-30),

12. 9395411 - Method for testing a test substrate under defined thermal conditions and thermally conditionable prober (2016-07-19),

13. 9377423 - Systems and methods for handling substrates at below dew point temperatures (2016-06-28),

14. 9373533 - Systems and methods for providing wafer access in a wafer processing system (2016-06-21),

15. 9372214 - High frequency interconnect structures, electronic assemblies that utilize high frequency interconnect structures, and methods of operating the same (2016-06-21),

Cascade Microtech, Inc. is a leading supplier of advanced wafer probing solutions for the electrical measurement and test of semiconductor devices. Their products enable semiconductor manufacturers to improve yields, reduce costs, and accelerate time-to-market for their integrated circuits. With innovative technologies and a customer-centric approach, Cascade Microtech is trusted by industry leaders worldwide for their high-performance probing systems.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Dec 23 2025

248 Patents

#5 in Beaverton, OR

#15 in Oregon

#1,648 in US

#3,383 in the World

Beaverton, OR, United States of America

Cascade Microtech, Inc.

Forward Citations = 6,950

118 inventors:

Kenneth R Smith (47 out of 54 patents)

K Reed Gleason (44 out of 46 patents)

Paul A Tervo (40 out of 42 patents)

4. Eric W Strid (37 out of 39 patents)

5. John L Dunklee (36 out of 48 patents)

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