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For the Inventor, By the Inventor

Beaverton, OR, United States of America

Cascade Microtech, Inc.


USPTO Granted Patents = 249

% Expired Patents = 57.4


Trademarks = 1

Forward Citations = 6,967

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122 inventors (with patents filed for the assignee):

goldMedal Kenneth R Smith (47 out of 54 patents)

silverMedal K Reed Gleason (44 out of 46 patents)

bronzeMedal Paul A Tervo (40 out of 42 patents)

4.  Eric W Strid (37 out of 39 patents)

5.  John L Dunklee (36 out of 48 patents)

6.  Leonard A Hayden (32 out of 33 patents)

7.  Mike Andrews (27 out of 28 patents)

8.  Warren K Harwood (25 out of 27 patents)

9.  Randy J Schwindt (25 out of 28 patents)

10.  Martin J Koxxy (24 out of 24 patents)

11.  Clarence E Cowan (23 out of 25 patents)

12.  John T Martin (22 out of 29 patents)

13.  Timothy E Lesher (16 out of 17 patents)

14.  Tim Lesher (14 out of 17 patents)

15.  Reed Gleason (13 out of 13 patents)


Core Competencies:
Probe Head Assemblies
Wafer-Handling End Effectors
Resilient Electrical Interposers
High Voltage Chuck
Optically Enhanced Imaging
Differential Signal Probing
Modular Prober
Testing Electronic Devices
Thermal Optical Chuck
EMI Shielding
Low Noise Connectors
Membrane Probing Structures

249 patents:

1. 12712282 - FLEXIBLE, RADIO-FREQUENCY TRANSITIONS AND ELECTRONIC SYSTEMS THAT INCLUDE THE FLEXIBLE, RADIO-FREQUENCY TRANSITIONS (2026-08-18),
2. 9991152 - Wafer-handling end effectors with wafer-contacting surfaces and sealing structures (2018-06-05),
3. 9989558 - Probe head assemblies, components thereof, test systems including the same, and methods of operating the same (2018-06-05),
4. 9983232 - Prober for testing devices in a repeat structure on a substrate (2018-05-29),
5. 9874585 - Resilient electrical interposers, systems that include the interposers, and methods for using and forming the same (2018-01-23),
6. 9804196 - Probes with fiducial marks, probe systems including the same, and associated methods (2017-10-31),
7. 9784763 - Shielded probe systems with controlled testing environments (2017-10-10),
8. 9741599 - High voltage chuck for a probe station (2017-08-22),
9. 9506973 - High voltage chuck for a probe station (2016-11-29),
10. 9470753 - Systems and methods for testing electronic devices that include low power output drivers (2016-10-18),
11. 9435858 - Focusing optical systems and methods for testing semiconductors (2016-09-06),
12. 9429638 - Method of replacing an existing contact of a wafer probing assembly (2016-08-30),
13. 9395411 - Method for testing a test substrate under defined thermal conditions and thermally conditionable prober (2016-07-19),
14. 9377423 - Systems and methods for handling substrates at below dew point temperatures (2016-06-28),
15. 9373533 - Systems and methods for providing wafer access in a wafer processing system (2016-06-21),
Cascade Microtech, Inc. is a leading supplier of advanced wafer probing solutions for the electrical measurement and test of semiconductor devices. Their products enable semiconductor manufacturers to improve yields, reduce costs, and accelerate time-to-market for their integrated circuits. With innovative technologies and a customer-centric approach, Cascade Microtech is trusted by industry leaders worldwide for their high-performance probing systems.
This text is generated by artificial intelligence and may not be accurate.

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USPTO Data Jan 1 1976 - Sep 15 2026

Cascade Microtech, Inc.
249 Patents

#4 in Beaverton, OR

#14 in Oregon

#1,713 in US

#3,487 in the World

Beaverton, OR (US)
Beaverton, OR, United States of America

Cascade Microtech, Inc.

Forward Citations = 6,967

122 inventors:

goldMedal Kenneth R Smith (47 out of 54 patents)

silverMedal K Reed Gleason (44 out of 46 patents)

bronzeMedal Paul A Tervo (40 out of 42 patents)

4.  Eric W Strid (37 out of 39 patents)

5.  John L Dunklee (36 out of 48 patents)

Please report any incorrect information to [email protected]
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