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Oberkochen, Germany

Carl Zeiss Multisem Gmbh

USPTO Granted Patents = 31

EPO Patents = 5

Trademarks = 1

Forward Citations = 116

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40 inventors (with patents filed for the assignee):

Dirk Zeidler (27 out of 44 patents)

Stefan Schubert (12 out of 24 patents)

Christof Riedesel (11 out of 20 patents)

4. Joerg Jacobi (9 out of 11 patents)

5. Ingo Mueller (8 out of 10 patents)

6. Arne Thoma (5 out of 7 patents)

7. Ralf Lenke (4 out of 7 patents)

8. Nico Kaemmer (4 out of 5 patents)

9. Gunther Scheunert (4 out of 4 patents)

10. Erik Essers (3 out of 14 patents)

11. Ulrich Bihr (3 out of 8 patents)

12. Yanko Sarov (3 out of 5 patents)

13. Mario Muetzel (3 out of 4 patents)

14. Antonio Casares (3 out of 12 patents)

15. Georgo Metalidis (3 out of 5 patents)

31 patents: Sort by Forward Citations

1. 12488958 - Method for operating a multi-beam particle beam microscope (2025-12-02),

2. 12431324 - Multi-beam digital scan and image acquisition (2025-09-30),

3. 12340973 - Particle beam system including a multi-beam deflection device and a beam stop, method for operating the particle beam system and associated computer program product (2025-06-24),

4. 12300462 - System comprising a multi-beam particle microscope and method for operating the same (2025-05-13),

5. 12293896 - Particle beam system (2025-05-06),

6. 12283457 - Multiple particle beam microscope and associated method with an improved focus setting taking into account an image plane tilt (2025-04-21),

7. 12272519 - Method for area-wise inspecting a sample via a multi-beam particle microscope, computer program product and multi-beam particle microscope for semiconductor sample inspection, and its use (2025-04-08),

8. 12255040 - Multi-beam particle beam system and method for operating same (2025-03-18),

9. 12249478 - Particle beam system for azimuthal deflection of individual particle beams and method for azimuth correction in a particle beam system (2025-03-11),

10. 12119204 - Particle beam system and the use thereof for flexibly setting the current intensity of individual particle beams (2024-10-15),

11. 12094683 - Method for operating a multi-beam particle beam microscope (2024-09-17),

12. 12057290 - Method for operating a multiple particle beam system while altering the numerical aperture, associated computer program product and multiple particle beam system (2024-08-06),

13. 11935721 - System comprising a multi-beam particle microscope and method for operating the same (2024-03-19),

14. 11735393 - Method for operating a multi-beam particle beam microscope (2023-08-22),

15. 11657999 - Particle beam system and method for the particle-optical examination of an object (2023-05-23),

Carl Zeiss MultiSEM GmbH specializes in electron microscopy technology. Their MultiSEM systems offer an innovative solution for high-throughput imaging with up to 91 parallel electron beams. This allows for the fast and efficient acquisition of large-scale, high-resolution 3D images of large samples. With its unique design and advanced software solutions, Carl Zeiss MultiSEM GmbH is at the forefront of pushing the boundaries of electron microscopy.

This text is generated by artificial intelligence and may not be accurate.

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USPTO Data Jan 1 1976 - Dec 2 2025

31 Patents

#10 in Oberkochen

#1,586 in Germany

#20,596 in the World

Oberkochen, Germany

Carl Zeiss Multisem Gmbh

Forward Citations = 116

40 inventors:

Dirk Zeidler (27 out of 44 patents)

Stefan Schubert (12 out of 24 patents)

Christof Riedesel (11 out of 20 patents)

4. Joerg Jacobi (9 out of 11 patents)

5. Ingo Mueller (8 out of 10 patents)

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