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Oberkochen, Germany

Carl Zeiss Multisem Gmbh

USPTO Granted Patents = 33

EPO Patents = 5

Trademarks = 1

Forward Citations = 138

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39 inventors (with patents filed for the assignee):

Dirk Zeidler (28 out of 45 patents)

Stefan Schubert (13 out of 25 patents)

Christof Riedesel (11 out of 20 patents)

4. Ingo Mueller (9 out of 11 patents)

5. Joerg Jacobi (9 out of 11 patents)

6. Arne Thoma (5 out of 7 patents)

7. Ralf Lenke (4 out of 7 patents)

8. Nico Kaemmer (4 out of 5 patents)

9. Gunther Scheunert (4 out of 4 patents)

10. Hans Fritz (4 out of 4 patents)

11. Erik Essers (3 out of 14 patents)

12. Ulrich Bihr (3 out of 8 patents)

13. Yanko Sarov (3 out of 5 patents)

14. Mario Muetzel (3 out of 4 patents)

15. Antonio Casares (3 out of 12 patents)

33 patents: Sort by Forward Citations

1. 12512291 - Particle beam system having a multi-pole lens sequence for independently focusing a multiplicity of individual particle beams, and its use and associated method (2025-12-30),

2. 12494343 - Multiple particle beam microscope and associated method with fast autofocus around an adjustable working distance (2025-12-09),

3. 12488958 - Method for operating a multi-beam particle beam microscope (2025-12-02),

4. 12431324 - Multi-beam digital scan and image acquisition (2025-09-30),

5. 12340973 - Particle beam system including a multi-beam deflection device and a beam stop, method for operating the particle beam system and associated computer program product (2025-06-24),

6. 12300462 - System comprising a multi-beam particle microscope and method for operating the same (2025-05-13),

7. 12293896 - Particle beam system (2025-05-06),

8. 12283457 - Multiple particle beam microscope and associated method with an improved focus setting taking into account an image plane tilt (2025-04-21),

9. 12272519 - Method for area-wise inspecting a sample via a multi-beam particle microscope, computer program product and multi-beam particle microscope for semiconductor sample inspection, and its use (2025-04-08),

10. 12255040 - Multi-beam particle beam system and method for operating same (2025-03-18),

11. 12249478 - Particle beam system for azimuthal deflection of individual particle beams and method for azimuth correction in a particle beam system (2025-03-11),

12. 12119204 - Particle beam system and the use thereof for flexibly setting the current intensity of individual particle beams (2024-10-15),

13. 12094683 - Method for operating a multi-beam particle beam microscope (2024-09-17),

14. 12057290 - Method for operating a multiple particle beam system while altering the numerical aperture, associated computer program product and multiple particle beam system (2024-08-06),

15. 11935721 - System comprising a multi-beam particle microscope and method for operating the same (2024-03-19),

Carl Zeiss MultiSEM GmbH specializes in electron microscopy technology. Their MultiSEM systems offer an innovative solution for high-throughput imaging with up to 91 parallel electron beams. This allows for the fast and efficient acquisition of large-scale, high-resolution 3D images of large samples. With its unique design and advanced software solutions, Carl Zeiss MultiSEM GmbH is at the forefront of pushing the boundaries of electron microscopy.

This text is generated by artificial intelligence and may not be accurate.

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USPTO Data Jan 1 1976 - Dec 30 2025

33 Patents

#10 in Oberkochen

#1,518 in Germany

#19,553 in the World

Oberkochen, Germany

Carl Zeiss Multisem Gmbh

Forward Citations = 138

39 inventors:

Dirk Zeidler (28 out of 45 patents)

Stefan Schubert (13 out of 25 patents)

Christof Riedesel (11 out of 20 patents)

4. Ingo Mueller (9 out of 11 patents)

5. Joerg Jacobi (9 out of 11 patents)

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