For the Inventor, By the Inventor

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Chongqing, China

The 59th Institute of China Ordnance Industry

USPTO Granted Patents = 2

Forward Citations = 2

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20 inventors (with patents filed for the assignee):

Taibin Wu (1 out of 2 patents)

Luchang Che (1 out of 2 patents)

Lin Zheng (1 out of 1 patent)

4. Shitao Dou (1 out of 1 patent)

5. Changguang He (1 out of 1 patent)

6. Zhengkun Peng (1 out of 1 patent)

7. Lunwu Zhang (1 out of 1 patent)

8. Xianhe Feng (1 out of 1 patent)

9. Yong Xiao (1 out of 1 patent)

10. Jin Zhang (1 out of 1 patent)

11. Kun Zhou (1 out of 2 patents)

12. Lunwu Zhang (1 out of 1 patent)

13. Xin Chen (1 out of 1 patent)

14. Shitao Dou (1 out of 1 patent)

15. Jin Zhang (1 out of 1 patent)

2 patents: Sort by Forward Citations

1. 12099025 - Device and method for measuring short-wavelength characteristic X-ray diffraction based on array detection (2024-09-24),

2. 11846595 - Diffraction device and method for non-destructive testing of internal crystal orientation uniformity of workpiece (2023-12-19),

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USPTO Data Jan 1 1976 - Dec 16 2025

2 Patents

#92 in Chongqing

#9,971 in China

Chongqing, China

The 59th Institute of China Ordnance Industry

Forward Citations = 2

20 inventors:

Taibin Wu (1 out of 2 patents)

Luchang Che (1 out of 2 patents)

Lin Zheng (1 out of 1 patent)

4. Shitao Dou (1 out of 1 patent)

5. Changguang He (1 out of 1 patent)

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