Taibin Wu

Title: Taibin Wu: Innovator in X-ray Diffraction and Superhard Materials

Introduction

Taibin Wu is a prominent inventor based in Chongqing, China. He has made significant contributions to the fields of X-ray diffraction and superhard materials. With a total of 2 patents, his work has advanced the understanding and application of these technologies.

Latest Patents

Wu's latest patents include a device and method for measuring short-wavelength characteristic X-ray diffraction based on array detection. This innovative device allows for rapid and non-destructive measurement of crystal structures within samples. The method utilizes an array detector to capture diffraction rays, enabling detailed analysis of the sample's internal characteristics, such as phase, texture, and stress.

Another notable patent is related to the preparation of Ti(C,N)-based superhard metal composite materials. This method involves using Ti(C,N) powder and (W,Mo,Ta)(C,N) powder as primary raw materials, along with Co powder as a binding phase. The resulting material features a unique double-core rim structure that enhances both hardness and toughness, making it suitable for various industrial applications.

Career Highlights

Throughout his career, Taibin Wu has worked with esteemed institutions, including Chongqing University of Arts and Sciences and the 59th Institute of China Ordnance Industry. His experience in these organizations has allowed him to collaborate with other experts in the field and contribute to groundbreaking research.

Collaborations

Wu has collaborated with notable colleagues, including Ying Deng and Shan Jiang. These partnerships have fostered innovation and have been instrumental in the development of his patented technologies.

Conclusion

Taibin Wu's contributions to the fields of X-ray diffraction and superhard materials demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of material science and its applications, positioning him as a key figure in his field.