Yong Xiao

Title: Yong Xiao - Innovator in Non-Destructive Testing Technology

Introduction

Yong Xiao is a prominent inventor based in China, known for his contributions to the field of non-destructive testing. His innovative work focuses on improving the efficiency of testing internal crystal orientation uniformity in various materials. With a single patent to his name, Yong has made significant strides in enhancing testing methodologies.

Latest Patents

Yong Xiao holds a patent for a diffraction device and method for non-destructive testing of internal crystal orientation uniformity of a workpiece. This invention includes an X-ray irradiation system that irradiates X-rays to a measured part of a sample under testing. Additionally, it features an X-ray detection system that simultaneously detects multiple diffracted X-rays formed by diffraction from various parts of the sample. This method allows for the measurement of X-ray diffraction intensity distribution, utilizing short-wavelength characteristic X-rays and an array detection system. The apparatus and method significantly improve detection efficiency.

Career Highlights

Yong Xiao is affiliated with the 59th Institute of China Ordnance Industry, where he applies his expertise in developing advanced testing technologies. His work has been instrumental in enhancing the capabilities of non-destructive testing, making it more efficient and reliable.

Collaborations

Yong has collaborated with notable colleagues, including Lin Zheng and Shitao Dou, contributing to various projects that aim to advance the field of non-destructive testing.

Conclusion

Yong Xiao's innovative contributions to non-destructive testing technology highlight his role as a key inventor in this field. His patent demonstrates a commitment to improving testing methodologies, ultimately benefiting various industries.