China, China

Lin Zheng


Average Co-Inventor Count = 8.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Lin Zheng - Innovator in Non-Destructive Testing Technology

Introduction

Lin Zheng is a prominent inventor based in China, known for his contributions to the field of non-destructive testing. He has developed innovative technologies that enhance the efficiency and accuracy of testing methods used in various industries. His work is particularly significant in the realm of crystal orientation uniformity testing.

Latest Patents

Lin Zheng holds a patent for a diffraction device and method for non-destructive testing of internal crystal orientation uniformity of a workpiece. This patent describes an apparatus that includes an X-ray irradiation system designed to irradiate X-rays to a measured part of a sample under testing. Additionally, it features an X-ray detection system that simultaneously detects multiple diffracted X-rays formed by diffraction from various parts of the sample. This method significantly improves detection efficiency by utilizing short-wavelength characteristic X-rays and an array detection system.

Career Highlights

Lin Zheng is affiliated with the 59th Institute of China Ordnance Industry, where he has made substantial contributions to research and development in his field. His innovative approach to non-destructive testing has positioned him as a key figure in advancing testing technologies.

Collaborations

Lin Zheng has collaborated with notable colleagues, including Shitao Dou and Changguang He. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Lin Zheng's work in non-destructive testing technology exemplifies the impact of innovation in enhancing industrial processes. His patented methods and collaborative efforts continue to influence the field positively.

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