The 59th Institute of China Ordnance Industry

Lin Zheng

Lunwu Zhang

Xianhe Feng

Changguang He

Shitao Dou

Yong Xiao

Zhengkun Peng

Jin Zhang

A diffraction apparatus and a method for non-destructively testing internal crystal orientation uniformity of a workpiece are provided. The apparatus includes: an X-ray irradiation system for irradiating an X-ray to a measured part of a sample under testing, and an X-ray detection system for simultaneously detecting a plurality of diffracted X-rays formed by diffraction of a plurality of parts of the sample under testing, to measure an X-ray diffraction intensity distribution of the sample under testing, where the detected diffracted X-rays are short-wavelength characteristic X-rays, and the X-ray detection system is an array detection system. By the apparatus and the method, the detection efficiency is greatly improved.

Diffraction device and method for non-destructive testing of internal crystal orientation uniformity of workpiece

Growing community of inventors

China, China

Lin Zheng