Jin Zhang

Title: Jin Zhang - Innovator in Non-Destructive Testing Technology

Introduction

Jin Zhang is a prominent inventor based in China, known for his contributions to the field of non-destructive testing. With a focus on improving detection efficiency, he has developed innovative technologies that enhance the analysis of internal crystal orientation in workpieces. His work is particularly significant in industries where material integrity is crucial.

Latest Patents

Jin Zhang holds a patent for a diffraction device and method for non-destructive testing of internal crystal orientation uniformity of a workpiece. This invention includes an X-ray irradiation system that irradiates X-rays to a measured part of a sample under testing. Additionally, it features an X-ray detection system that simultaneously detects multiple diffracted X-rays formed by diffraction from various parts of the sample. The system measures the X-ray diffraction intensity distribution, utilizing short-wavelength characteristic X-rays and an array detection system. This innovative approach greatly improves detection efficiency.

Career Highlights

Jin Zhang is affiliated with the 59th Institute of China Ordnance Industry, where he applies his expertise in developing advanced testing technologies. His work has been instrumental in enhancing the reliability and efficiency of non-destructive testing methods.

Collaborations

Jin Zhang collaborates with notable colleagues, including Lin Zheng and Shitao Dou, who contribute to the research and development efforts at the institute. Their combined expertise fosters an environment of innovation and progress in the field.

Conclusion

Jin Zhang's contributions to non-destructive testing technology exemplify the importance of innovation in ensuring material integrity. His patented methods and devices represent significant advancements in the industry, showcasing his commitment to enhancing detection efficiency.