Lunwu Zhang

Title: Lunwu Zhang: Innovator in Non-Destructive Testing Technology

Introduction

Lunwu Zhang is a prominent inventor based in China, known for his contributions to the field of non-destructive testing. His innovative work focuses on improving the efficiency of testing internal crystal orientation uniformity in various materials. With a single patent to his name, Zhang has made significant strides in advancing technology in this area.

Latest Patents

Zhang's notable patent is titled "Diffraction device and method for non-destructive testing of internal crystal orientation uniformity of workpiece." This invention provides a diffraction apparatus and method designed to non-destructively test the internal crystal orientation uniformity of a workpiece. The apparatus features an X-ray irradiation system that directs X-rays to the measured part of a sample under testing. Additionally, it includes an X-ray detection system that simultaneously detects multiple diffracted X-rays generated by the diffraction of various parts of the sample. This method significantly enhances detection efficiency by measuring the X-ray diffraction intensity distribution of the sample.

Career Highlights

Lunwu Zhang is affiliated with the 59th Institute of China Ordnance Industry, where he applies his expertise in developing advanced testing technologies. His work has contributed to the improvement of quality control processes in manufacturing and materials science.

Collaborations

Zhang has collaborated with notable colleagues, including Lin Zheng and Shitao Dou, who share his commitment to innovation in the field of non-destructive testing.

Conclusion

Lunwu Zhang's contributions to non-destructive testing technology exemplify the impact of innovative thinking in engineering and materials science. His patent reflects a significant advancement in the efficiency of testing methods, showcasing his role as a key inventor in this specialized field.