Zhengkun Peng

Title: Zhengkun Peng: Innovator in Non-Destructive Testing Technologies

Introduction

Zhengkun Peng is a notable inventor based in China, recognized for his contributions to the field of non-destructive testing. His innovative work focuses on improving the efficiency of testing internal crystal orientation uniformity in various workpieces. With a single patent to his name, Zhengkun has made significant strides in enhancing testing methodologies.

Latest Patents

Zhengkun Peng holds a patent for a "Diffraction device and method for non-destructive testing of internal crystal orientation uniformity of workpiece." This invention provides a diffraction apparatus and method that allows for non-destructive testing of a workpiece's internal crystal orientation uniformity. The apparatus features an X-ray irradiation system that directs X-rays to the measured part of a sample, along with an X-ray detection system that simultaneously detects multiple diffracted X-rays. This innovative approach significantly improves detection efficiency by utilizing short-wavelength characteristic X-rays and an array detection system.

Career Highlights

Zhengkun Peng is affiliated with the 59th Institute of China Ordnance Industry, where he applies his expertise in developing advanced testing technologies. His work has contributed to the enhancement of quality control processes in various industrial applications.

Collaborations

Zhengkun has collaborated with notable colleagues, including Lin Zheng and Shitao Dou, to further advance the field of non-destructive testing. Their combined efforts have led to innovative solutions that address complex challenges in material testing.

Conclusion

Zhengkun Peng's contributions to non-destructive testing technologies exemplify the impact of innovation in industrial applications. His patent reflects a commitment to improving testing efficiency and accuracy, marking him as a significant figure in his field.