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For the Inventor, By the Inventor

Tsukuba, Japan

Yuichiro Yokoyama

This inventor holds 14 USPTO granted patents and 8 EPO patents. Top assignee: Mitutoyo Corporation. Active years: 2009-2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yuichiro Yokoyama. Retrieved from https://idiyas.com/inventor/yuichiro-yokoyama

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 14

% Patents Active = 92.9

 

Average Co-Inventor Count = 1.8

ph-index = 2

Forward Citations = 15(Granted Patents)


Location History:

  • Tsukuba, JP (2009 - 2016)
  • Ibaraki, JP (2016 - 2019)
  • Abiko, JP (2019 - 2021)
  • Chiba, JP (2022)

Company Filing History:

goldMedal14 out of 1,678 
 
Mitutoyo Corporation
 patents

Years Active: 2009-2022

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14 patents (USPTO):Explore Patents
1. 11378386 - Laser interference device (2022-07-05),
2. 11353315 - Laser interference device (2022-06-07),
3. 10969355 - Measuring device for coefficient of thermal expansion and measurement method for coefficient of thermal expansion (2021-04-06),
4. 10900917 - Measuring device for coefficient of thermal expansion and measurement method for coefficient of thermal expansion (2021-01-26),
5. 10627204 - Coefficient-of-thermal-expansion measurement method and measuring device for coefficient of thermal expansion (2020-04-21),
6. 10444008 - Spherical shape measurement method and apparatus for rotating a sphere about first rotation axis and rotating a sphere hold mechanism about second rotation axis orthogonal to first rotation axis (2019-10-15),
7. 10352678 - Coefficient-of-thermal-expansion measurement method of dimension reference gauge, measuring device for coefficient of thermal expansion and reference gauge (2019-07-16),
8. 9518944 - Temperature-controlled bath (2016-12-13),
9. 9347771 - Spherical shape measurement method and apparatus (2016-05-24),
10. 9297631 - Spherical-form measuring apparatus (2016-03-29),
11. 8879068 - Abscissa calibration jig and abscissa calibration method of laser interference measuring apparatus (2014-11-04),
12. 8379222 - Fizeau interferometer and measurement method using Fizeau interferometer (2013-02-19),
13. 8356417 - Spherical-form measuring apparatus (2013-01-22),
14. 7486404 - Size difference measuring method and size difference measuring apparatus (2009-02-03),

Title: Yuichiro Yokoyama: Innovator in Laser Interference Technology

Introduction

Yuichiro Yokoyama is a prominent inventor based in Tsukuba, Japan. He has made significant contributions to the field of laser technology, holding a total of 14 patents. His work focuses on developing advanced laser interference devices that enhance measurement accuracy and efficiency.

Latest Patents

Among his latest innovations is a laser interference device that features a measurement mirror capable of moving in an X direction. This device includes a reference mirror positioned differently in a Y direction, along with a beam splitter that divides a laser beam into measurement and reference lights. The design ensures that the mechanical and optical path lengths of the first and second distribution paths are equal. Another notable patent involves a laser interference device that utilizes a measurement laser to output a laser beam, which is then divided by a beam splitter. This device incorporates a frequency detector, a wavelength calculator, and a displacement calculator to enhance measurement precision.

Career Highlights

Yuichiro Yokoyama is currently employed at Mitutoyo Corporation, a leading company in precision measurement technology. His work at Mitutoyo has allowed him to push the boundaries of laser measurement applications, contributing to advancements in various scientific and industrial fields.

Collaborations

He has collaborated with notable coworkers, including Takeshi Hagino and Yutaka Kuriyama, who have also contributed to the development of innovative technologies in their respective areas.

Conclusion

Yuichiro Yokoyama's contributions to laser interference technology exemplify his dedication to innovation and precision in measurement. His patents reflect a commitment to advancing the field and improving measurement techniques across various applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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