The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 22, 2013
Filed:
Jan. 19, 2011
Takeshi Hagino, Tsukuba, JP;
Yuichiro Yokoyama, Tsukuba, JP;
Takeshi Hagino, Tsukuba, JP;
Yuichiro Yokoyama, Tsukuba, JP;
Mitutoyo Corporation, Kawasaki-shi, JP;
Abstract
A spherical-form measuring apparatus which efficiently measures the sphericity and the form of a sphere to be measured with use of the mechanism of a roundness measuring machine, including a turntable, a probe for measuring a contour of a sphere to be measured on an equatorial plane parallel to a surface of the turntable, associated with rotation of the turntable, and a holding unit mounted on the turntable, for holding the sphere to be measured, wherein the holding unit positions the center of the sphere to be measured on a rotational axis of the turntable, and holds the sphere to be measured so that the sphere is rotatable about an inclined axis which passes the center of the sphere and is inclined at the angle in the range of −5 degrees-+5 degrees centered on the angle where the sine is 1√3 (1 divided by the square root of 3) against the surface of the turntable.