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For the Inventor, By the Inventor

Tsukuba, Japan

Takeshi Hagino

This inventor holds 13 USPTO granted patents and 7 EPO patents. Top assignee: Mitutoyo Corporation. Active years: 2013-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takeshi Hagino. Retrieved from https://idiyas.com/inventor/takeshi-hagino

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 13

% Patents Active = 92.3

 

Average Co-Inventor Count = 2.2

ph-index = 2

Forward Citations = 15(Granted Patents)


Location History:

  • Tsukuba, JP (2013 - 2021)
  • Ibaraki, JP (2016 - 2022)

Company Filing History:

goldMedal13 out of 1,679 
 
Mitutoyo Corporation
 patents

Years Active: 2013-2025

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13 patents (USPTO):Explore Patents
1. 12392605 - Method of estimating uncertainty of coordinate measurement (2025-08-19),
2. 11530908 - Measurement point determination method, non-transitory storage medium, and measurement point determination apparatus (2022-12-20),
3. 10969355 - Measuring device for coefficient of thermal expansion and measurement method for coefficient of thermal expansion (2021-04-06),
4. 10900917 - Measuring device for coefficient of thermal expansion and measurement method for coefficient of thermal expansion (2021-01-26),
5. 10627204 - Coefficient-of-thermal-expansion measurement method and measuring device for coefficient of thermal expansion (2020-04-21),
6. 10444008 - Spherical shape measurement method and apparatus for rotating a sphere about first rotation axis and rotating a sphere hold mechanism about second rotation axis orthogonal to first rotation axis (2019-10-15),
7. 10352678 - Coefficient-of-thermal-expansion measurement method of dimension reference gauge, measuring device for coefficient of thermal expansion and reference gauge (2019-07-16),
8. 9518944 - Temperature-controlled bath (2016-12-13),
9. 9347771 - Spherical shape measurement method and apparatus (2016-05-24),
10. 9297631 - Spherical-form measuring apparatus (2016-03-29),
11. 8879068 - Abscissa calibration jig and abscissa calibration method of laser interference measuring apparatus (2014-11-04),
12. 8379222 - Fizeau interferometer and measurement method using Fizeau interferometer (2013-02-19),
13. 8356417 - Spherical-form measuring apparatus (2013-01-22),

Title: Innovations of Takeshi Hagino

Introduction

Takeshi Hagino is a prominent inventor based in Tsukuba, Japan. He has made significant contributions to the field of measurement technology, holding a total of 13 patents. His work focuses on enhancing the accuracy and reliability of coordinate measurement systems.

Latest Patents

One of his latest patents is a method of estimating uncertainty in coordinate measurement. This method involves acquiring first variable values that represent a relationship between measurement dimensions and permissible length measurement errors. It also includes calculating maximum permissible length measurement errors based on varying measurement conditions. Another notable patent is a measurement point determination method, which aims to optimize the arrangement of measurement points for measurement apparatuses. This method estimates uncertainties based on target values and determines the optimal number of measurement points required for accurate measurements.

Career Highlights

Takeshi Hagino is currently employed at Mitutoyo Corporation, a leading company in precision measurement instruments. His innovative approaches have significantly advanced the capabilities of measurement technologies, making them more efficient and reliable.

Collaborations

He has collaborated with notable coworkers such as Yuichiro Yokoyama and Yutaka Kuriyama, contributing to various projects that enhance measurement methodologies.

Conclusion

Takeshi Hagino's contributions to measurement technology through his patents and collaborations have established him as a key figure in the field. His work continues to influence advancements in precision measurement systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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