The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2014
Filed:
Jul. 20, 2012
Applicants:
Takeshi Hagino, Tsukuba, JP;
Yuichiro Yokoyama, Tsukuba, JP;
Yutaka Kuriyama, Tsukuba, JP;
Inventors:
Assignee:
Mitutoyo Corporation, Kanagawa, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G01B 11/00 (2006.01);
U.S. Cl.
CPC ...
G01B 11/00 (2013.01);
Abstract
An abscissa calibration jig of a laser interference measuring apparatus, includes: an image projection unit configured to project an image with a marker; a first support mechanism configured to rotatably support the image projection unit around a first rotation axis passing a predetermined rotation center; and a second support mechanism configured to rotatably support the first support mechanism around a second rotation axis crossing the first rotation axis at the rotation center.