Yossi Simon

USPTO Granted Patents = 7 (Patent Applications = 1)

Average Co-Inventor Count = 8.0

ph-index = 2

Forward Citations = 8(Granted Patents)

Location History:

Milpitas, CA (US) (2023)
Qiryat Atta, IL (2020 - 2024)

Company Filing History:

Kla Tencor Corporation

patents

Years Active: 2020-2025

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7 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12379669 - Massive overlay metrology sampling with multiple measurement columns (2025-08-05),

2. 12222199 - Systems and methods for measurement of misregistration and amelioration thereof (2025-02-11),

3. 12131959 - Systems and methods for improved metrology for semiconductor device wafers (2024-10-29),

4. 12001148 - Enhancing performance of overlay metrology (2024-06-04),

5. 11592755 - Enhancing performance of overlay metrology (2023-02-28),

6. 11556738 - System and method for determining target feature focus in image-based overlay metrology (2023-01-17),

7. 10684563 - On the fly target acquisition (2020-06-16),

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1 patent pending:

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