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For the Inventor, By the Inventor

Daejeon, South Korea

Yong Jai Cho

This inventor holds 15 USPTO granted patents and 2 published patent applications and 1 EPO patent. Top assignees: Korea Research Institute of Standards and Science, K-Mac. Active years: 2011-2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yong Jai Cho. Retrieved from https://idiyas.com/inventor/yong-jai-cho

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 15 

% Patents Active = 100.0

 

Average Co-Inventor Count = 3.2

ph-index = 2

Forward Citations = 21(Granted Patents)


Location History:

  • Yuseong-gu, KR (2014)
  • Daejeon, KR (2011 - 2023)

Company Filing History:

goldMedal15 out of 309 
 
Korea Research Institute of Standards and Science
 patents
silverMedal1 out of 5 
 
K-Mac
 patents
where one patent can have more than one assignee

Years Active: 2011-2024

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15 patents (USPTO):Explore Patents
1. 12152982 - Device and method for multi-reflection solution immersed silicon-based microchannel measurement (2024-11-26),
2. 11719624 - Liquid immersion micro-channel measurement device and measurement method which are based on trapezoidal incident structure prism incident-type silicon (2023-08-08),
3. 11493433 - Normal incidence ellipsometer and method for measuring optical properties of sample by using same (2022-11-08),
4. 10921241 - Oblique incidence, prism-incident, silicon-based, immersion microchannel-based measurement device and measurement method (2021-02-16),
5. 10458901 - Apparatus and method for simultaneously measuring characteristics of molecular junctions and refractive index of buffer solution (2019-10-29),
6. 10317334 - Achromatic rotating-element ellipsometer and method for measuring mueller-matrix elements of sample using the same (2019-06-11),
7. 10145785 - Optical element rotation type Mueller-matrix ellipsometer and method for measuring Mueller-matrix of sample using the same (2018-12-04),
8. 9581498 - Rotating-element spectroscopic ellipsometer and method for measurement precision prediction of rotating-element spectroscopic ellipsometer, recording medium storing program for executing the same, and computer program stored in medium for executing the same (2017-02-28),
9. 8940538 - Apparatus and method for quantifying binding and dissociation kinetics of molecular interactions (2015-01-27),
10. 8830463 - Rotating-element ellipsometer and method for measuring properties of the sample using the same (2014-09-09),
11. 8705039 - Surface plasmon resonance sensor using vertical illuminating focused-beam ellipsometer (2014-04-22),
12. 8705033 - Multi-channel surface plasmon resonance sensor using beam profile ellipsometry (2014-04-22),
13. 8447546 - Measurement of Fourier coefficients using integrating photometric detector (2013-05-21),
14. 8300221 - Minute measuring instrument for high speed and large area and method thereof (2012-10-30),
15. 8004677 - Focused-beam ellipsometer (2011-08-23),

Title: Innovations of Yong Jai Cho

Introduction

Yong Jai Cho is a prominent inventor based in Daejeon, South Korea. He has made significant contributions to the field of micro-channel measurement technology, holding a total of 15 patents. His work focuses on enhancing measurement sensitivity through innovative device designs.

Latest Patents

One of his latest patents is a device and method for multi-reflection solution immersed silicon-based microchannel measurement. This invention improves measurement sensitivity by completely separating first reflective light from a sample detection layer and second reflective light from a prism-buffer solution interface. The device allows light to enter multiple times through multi-reflection, enhancing the accuracy of measurements. Another notable patent is a liquid immersion micro-channel measurement device based on a trapezoidal incident structure prism incident-type silicon. This device includes a micro-channel structure with a sample detection layer and a quadrangular pyramid-shaped prism, which facilitates the detection of polarization changes in reflected light.

Career Highlights

Yong Jai Cho has worked with esteemed organizations such as the Korea Research Institute of Standards and Science and K-MAC. His experience in these institutions has contributed to his expertise in developing advanced measurement technologies.

Collaborations

He has collaborated with notable colleagues, including Hyun Mo Cho and Won Chegal, who have also contributed to the field of micro-channel measurement.

Conclusion

Yong Jai Cho's innovative work in micro-channel measurement technology has led to significant advancements in the field. His patents reflect a commitment to improving measurement techniques, showcasing his role as a leading inventor in this area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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