Yan Xiong

Title: Yan Xiong: Innovator in Defect Detection Technologies

Introduction

Yan Xiong is a prominent inventor based in Sunnyvale, CA, known for his contributions to defect detection technologies. With a total of 9 patents to his name, he has made significant advancements in systems and methods for identifying defects in various specimens.

Latest Patents

One of Yan Xiong's latest patents is focused on defect detection using structural information. This innovative system includes computer subsystems designed to separate outputs generated by inspection detectors into segments based on structural characteristics. This allows for more accurate defect detection by applying various methods to the outputs from different segments. Another notable patent is related to process excursion detection, which involves analyzing defect information on substrates by logically dividing them into zones. This method enables the classification of defects within each zone, enhancing the analysis of defect levels through various techniques.

Career Highlights

Throughout his career, Yan Xiong has worked with notable companies such as KLA-Tencor Corporation and KLA-Tencor Technologies Corporation. His experience in these organizations has contributed to his expertise in defect detection technologies and systems.

Collaborations

Yan has collaborated with several professionals in his field, including Patrick Huet and Robinson Piramuthu. These collaborations have further enriched his work and innovations in defect detection.

Conclusion

Yan Xiong's contributions to defect detection technologies have established him as a key figure in the field. His innovative patents and career achievements reflect his dedication to advancing technology in this area.