Morgan Hill, CA, United States of America

Viktor Koldiaev

USPTO Granted Patents = 21 


Average Co-Inventor Count = 2.8

ph-index = 8

Forward Citations = 154(Granted Patents)


Location History:

  • San Jose, CA (US) (2006 - 2012)
  • Morgan Hill, CA (US) (2013 - 2024)

Company Filing History:


Years Active: 2006-2025

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21 patents (USPTO):

Title: Viktor Koldiaev: An Innovator in Semiconductor Metrology

Introduction

Viktor Koldiaev, based in Morgan Hill, CA, is a prolific inventor with an impressive portfolio of 20 patents. His work primarily focuses on advancements in semiconductor metrology, employing cutting-edge technologies to enhance the accuracy and effectiveness of material property analysis.

Latest Patents

Among his latest innovations are two significant patents. The first patent details systems for parsing material properties from within second harmonic generation (SHG) signals. This technology is designed to improve semiconductor metrology systems by directing radiation onto a wafer, detecting SHG radiation emitted from it, and correlating this signal to various electrical properties of the wafer. Additionally, this patent encompasses methods for parsing SHG signals to eliminate contributions from material properties such as thickness.

His second notable patent discusses the use of pump and probe type second harmonic generation metrology. This approach utilizes second harmonic generation to interrogate the surfaces of layered semiconductor structures on wafers, allowing for precise determination of current flow from samples subjected to radiation illumination.

Career Highlights

Viktor has worked with reputable companies in the tech industry, notably Femtometrix, Inc. and Micron Technology Incorporated. His experiences in these organizations have significantly contributed to his expertise in semiconductor technologies and innovations.

Collaborations

Throughout his career, Viktor has collaborated with talented individuals such as John Paul Changala and Marc Kryger. These partnerships have fostered an environment of innovation and have resulted in significant advancements in the field of metrology.

Conclusion

Viktor Koldiaev’s contributions to semiconductor metrology reflect a strong commitment to innovation and a deep understanding of material properties. His patents not only enhance the efficiency of semiconductor analysis but also exemplify the importance of collaborative efforts in driving technological advancement. As the field of semiconductor technology continues to evolve, inventors like Viktor will play a crucial role in shaping its future.

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