The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2015

Filed:

Jul. 11, 2013
Applicants:

Viktor Koldiaev, Morgan Hill, CA (US);

Rimma Pirogova, Morgan Hill, CA (US);

Inventors:

Viktor Koldiaev, Morgan Hill, CA (US);

Rimma Pirogova, Morgan Hill, CA (US);

Assignee:

Finscale Inc., Dublin, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 27/088 (2006.01); H01L 27/092 (2006.01); H01L 29/06 (2006.01); H01L 21/8238 (2006.01); H01L 27/108 (2006.01); H01L 27/12 (2006.01); H01L 21/84 (2006.01); H01L 29/66 (2006.01); H01L 29/78 (2006.01); H01L 27/11 (2006.01); H01L 27/115 (2006.01);
U.S. Cl.
CPC ...
H01L 27/092 (2013.01); H01L 21/823814 (2013.01); H01L 21/845 (2013.01); H01L 27/088 (2013.01); H01L 27/108 (2013.01); H01L 27/1211 (2013.01); H01L 29/66795 (2013.01); H01L 29/785 (2013.01); H01L 27/10826 (2013.01); H01L 27/10879 (2013.01); H01L 27/1104 (2013.01); H01L 27/11521 (2013.01);
Abstract

The present invention is a semiconductor device comprising a semiconducting low doped vertical super-thin body (VSTB) formed on Dielectric Body Wall (such as STI-wall as isolating substrate) having the body connection to bulk semiconductor wafer on the bottom side, isolation on the top side, and the channel, gate dielectric, and gate electrode on opposite to STI side surface. The body is made self-aligned to STI hard mask edge allowing tight control of body thickness. Source and Drain are made by etching holes vertically in STI at STI side of the body and filling with high doped crystalline or poly-Si appropriately doped with any appropriate silicides/metal contacts or with Schottky barrier Source/Drain. Gate first or Gate last approaches can be implemented. Many devices can be fabricated in single active area with body isolation between the devices by iso-plugs combined with gate electrode isolation by iso-trenches. The body can be made as an isolated nano-plate or set nano-wire MOSFET's on the STI wall to form VSTB SOI devices.


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