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For the Inventor, By the Inventor

Yokohama, Japan

Toshiyuki Nakao

This inventor holds 33 USPTO granted patents and 4 published patent applications, primarily in Defect Inspection Technology. Top assignees: Hitachi-High-Technologies Corporation, Hitachi High-Technologies Corporaiton, Ricoh Company, Ltd.. Active years: 2007-2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Toshiyuki Nakao. Retrieved from https://idiyas.com/inventor/toshiyuki-nakao

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 33 

% Patents Active = 42.4

Average Co-Inventor Count = 3.5

ph-index = 6

Forward Citations = 92(Granted Patents)


Location History:

  • Yokohama, JP (2007 - 2019)
  • Tokyo, JP (2015 - 2019)

Company Filing History:

goldMedal31 out of 2,874 
 
Hitachi-High-Technologies Corporation
 patents
silverMedal1 out of 2 
 
Hitachi High-Technologies Corporaiton
 patents
bronzeMedal1 out of 28,951 
 
Ricoh Company, Ltd.
 patents

Years Active: 2007-2019

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Areas of Expertise:
X-Ray Inspection
Defect Detection
Surface Analysis
Fault Inspection
Inspection Apparatus
Defect Inspection Device
Method for Inspecting Defects
Apparatus for Defect Inspection
Device Management
Substrate Surface Inspection
Flaw Detection
Inspection Method
33 patents (USPTO):Explore Patents
1. 10352879 - X-ray inspection method and device (2019-07-16),
2. 10254235 - Defect inspecting method and defect inspecting apparatus (2019-04-09),
3. 9841384 - Defect inspecting method and defect inspecting apparatus (2017-12-12),
4. 9506872 - Inspection apparatus (2016-11-29),
5. 9228960 - Defect inspecting method and defect inspecting apparatus (2016-01-05),
6. 9041921 - Defect inspection device and defect inspection method (2015-05-26),
7. 8958062 - Defect inspection method and device using same (2015-02-17),
8. 8934092 - Surface defect inspection method and apparatus (2015-01-13),
9. 8804110 - Fault inspection device and fault inspection method (2014-08-12),
10. 8711347 - Defect inspection method and device therefor (2014-04-29),
11. 8705026 - Inspection apparatus (2014-04-22),
12. 8670116 - Method and device for inspecting for defects (2014-03-11),
13. 8654350 - Inspecting method and inspecting apparatus for substrate surface (2014-02-18),
14. 8638429 - Defect inspecting method and defect inspecting apparatus (2014-01-28),
15. 8599369 - Defect inspection device and inspection method (2013-12-03),

Title: Toshiyuki Nakao: Pioneering Inventor from Yokohama

Introduction: Toshiyuki Nakao is a renowned inventor hailing from Yokohama, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Toshiyuki Nakao holds several patents in the areas of robotics, artificial intelligence, and renewable energy technologies, showcasing his continuous commitment to pushing the boundaries of technological advancement.

Career Highlights: With over two decades of experience in the tech industry, Nakao has worked with leading research institutions and companies to develop cutting-edge solutions that have revolutionized various sectors.

Collaborations: Throughout his career, Toshiyuki Nakao has collaborated with top engineers, scientists, and inventors globally, fostering a culture of innovation and knowledge exchange that has led to the development of impactful technologies.

Conclusion: Toshiyuki Nakao's relentless pursuit of innovation and his passion for creating solutions that address real-world challenges have solidified his position as a trailblazer in the world of technology and invention.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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