Tokyo, Japan

Toshio Matsuura

This inventor holds 21 USPTO granted patents, primarily in Photolithography Techniques. Top assignees: Nikon Corporation, Nippon Kogaku K.k., Jeol Ltd.. Active years: 1984-2002.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Toshio Matsuura. Retrieved from https://idiyas.com/inventor/toshio-matsuura

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.5

ph-index = 13

Forward Citations = 641(Granted Patents)


Location History:

  • Koshigaya, JP (1984 - 1988)
  • Tokyo, JP (1988 - 2002)

Company Filing History:


Years Active: 1984-2002

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Areas of Expertise:
Exposure Method
Exposure Apparatus
Position Measurement
Photolithography
Mask Pattern
Semiconductor Device
Alignment Apparatus
Interferometers
Projection Exposure
Noise Free Frequency
Position Detection
Holographic Techniques
21 patents (USPTO):Explore Patents

Title: Toshio Matsuura: A Pioneer in Exposure Technology

Introduction

Toshio Matsuura, a distinguished inventor based in Tokyo, Japan, has made significant contributions to the field of photolithography, particularly with his work on exposure methods and apparatuses. With a remarkable portfolio of 21 patents, Matsuura's innovations have had a profound impact on the manufacturing processes used in semiconductor production.

Latest Patents

Among his latest inventions is an advanced exposure method and exposure apparatus designed to enhance the pattern transfer process from a mask to a substrate. This apparatus is innovative in that it overlays the peripheral portions of exposure areas concerning an already transferred pattern image, ensuring precise alignment and improved pattern integrity. It includes a dose adjusting device capable of fine-tuning the exposure light dosage at the overlying section, aided by a shape measuring unit that monitors the resultant pattern shape on the substrate. The system’s control section adjusts the dosage based on real-time measurements, delivering outcomes that meet specified design criteria.

Another notable patent is a position measurement method for determining the accuracy of exposure masks. In this process, marks from a correction mask are initially measured and then transferred to a photosensitive substrate to compare their positions post-transfer. The deviations detected inform necessary corrections for subsequent exposure masks, enhancing the precision of the lithographic process.

Career Highlights

Toshio Matsuura's professional journey includes significant tenures at leading technology companies, including Nikon Corporation and Nippon Kogaku K.K. His work in these organizations has facilitated the development of cutting-edge lithography equipment that has paved the way for advancements in electronic fabrication techniques.

Collaborations

Throughout his career, Matsuura has collaborated with prominent individuals in the industry, including colleagues Kyoichi Suwa and Kei Nara. These partnerships have fostered an environment of innovation and have led to the successful completion of various projects aimed at pushing the boundaries of exposure technology.

Conclusion

Toshio Matsuura's contributions to the field of photolithography highlight his role as a leading inventor and innovator. His extensive patent portfolio not only underscores his expertise but also reflects his commitment to advancing technology in semiconductor manufacturing. Matsuura's work continues to influence the industry, ensuring that he remains a pivotal figure in the evolution of exposure methods and apparatuses.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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