The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 1994

Filed:

Mar. 14, 1990
Applicant:
Inventors:

Mineo Kumazawa, Tokyo, JP;

Yuichi Imanishi, Tokyo, JP;

Toshio Matsuura, Tokyo, JP;

Assignee:

Jeol Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
364572 ; 364485 ;
Abstract

Method of making a spectral analysis of a free induction decay signal picked up by a pulse nuclear magnetic resonance spectrometer. The sine component and the cosine component of the signal which are .pi./2 out-of-phase are sampled. The resulting data is analyzed by the Sompi method extended to the complex domain. The Sompi method utilizes an autoregressive model.


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