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For the Inventor, By the Inventor

Tsukuba, Japan

Tomotaka Takahashi

This inventor holds 13 USPTO granted patents and 5 EPO patents. Top assignees: Mitutoyo Corporation, 3D Innovation Co., Ltd. Active years: 2006-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tomotaka Takahashi. Retrieved from https://idiyas.com/inventor/tomotaka-takahashi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 13

% Patents Active = 76.9

 

Average Co-Inventor Count = 1.4

ph-index = 3

Forward Citations = 121(Granted Patents)


Location History:

  • Kawasaki, JP (2006 - 2011)
  • Tsukuba, JP (2011 - 2024)

Company Filing History:

goldMedal13 out of 1,679 
 
Mitutoyo Corporation
 patents
silverMedal1 out of 1 
 
3D Innovation Co., Ltd
 patent
where one patent can have more than one assignee

Years Active: 2006-2026

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13 patents (USPTO):Explore Patents
1. 12571915 - Measurement apparatus and measurement method (2026-03-10),
2. 11879975 - Measurement apparatus and measurement method (2024-01-23),
3. 11867809 - Measurement apparatus and measurement method (2024-01-09),
4. 11415406 - Single sideband frequency modulated laser measurement for detecting a difference in a propagation distance (2022-08-16),
5. 8895911 - Optical encoder with misalignment detection and adjustment method associated therewith (2014-11-25),
6. 8666261 - Photoelectric encoder (2014-03-04),
7. 8363904 - Offset amount calibrating method and surface texture measuring machine (2013-01-29),
8. 8173951 - Optical encoder comprising a main and reference light receiving portions with a three-phase signal generation for detecting displacement and direction of displacement of an incremental grating track (2012-05-08),
9. 8018600 - Interferometer for measuring displacement information of an object (2011-09-13),
10. 7980769 - Vacuum optical fiber connector and optical fiber terminal structure (2011-07-19),
11. 7394550 - Displacement detector (2008-07-01),
12. 7319526 - Apparatus for detecting displacement (2008-01-15),
13. 7095011 - Photoelectric encoder for precise measurements (2006-08-22),

Title: Tomotaka Takahashi: Innovator in Measurement Technology

Introduction

Tomotaka Takahashi is a prominent inventor based in Tsukuba, Japan. He has made significant contributions to the field of measurement technology, holding a total of 13 patents. His innovative work has advanced the capabilities of measurement apparatuses, making them more efficient and precise.

Latest Patents

Takahashi's latest patents include a measurement apparatus and method that utilizes a frequency-modulated laser beam. This apparatus features a laser that outputs the beam, a branch that splits it into reference and measurement light, and a beat signal generator that creates a beat signal by mixing the reference light with a reflected light from an object. Additionally, it includes a frequency analyzer and calculation circuitry that computes the difference in propagation distances of the two light paths. Another patent describes a similar measurement apparatus that incorporates a branching part, a beat signal generation part, and a digital filter to enhance the accuracy of measurements.

Career Highlights

Throughout his career, Tomotaka Takahashi has worked with notable companies such as Mitutoyo Corporation and 3D Innovation Co., Ltd. His experience in these organizations has allowed him to refine his skills and contribute to groundbreaking advancements in measurement technology.

Collaborations

Takahashi has collaborated with talented individuals in his field, including Shinji Komatsuzaki and Hiroki Ujihara. These partnerships have fostered innovation and have led to the development of advanced measurement solutions.

Conclusion

Tomotaka Takahashi's contributions to measurement technology through his patents and collaborations highlight his role as a leading inventor in this field. His work continues to influence the industry and pave the way for future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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