The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7319526 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 15, 2008

Filed:

Nov. 09, 2004
Applicant:

Tomotaka Takahashi, Kawasaki, JP;

Inventor:

Tomotaka Takahashi, Kawasaki, JP;

Assignee:

Mitutoyo Corporation, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A displacement detection apparatus () includes a main scale () and a detection head (). The detection head () includes a light emission/reception unit () and an optical device unit (). The optical device unit () has a first diffraction scale () and a second diffraction scale (). The first diffraction scale () has a transmission type first diffraction grating (). The second diffraction scale () has a diffraction grating. The second diffraction scale () has a transmission type second diffraction grating () on both sides of a metal film (). Furthermore, the metal film () configures a reflection type third diffraction grating () when the second diffraction scale () is viewed from the side of the main scale ().


Find Patent Forward Citations

Takahashi, Tomotaka. (2008). Apparatus for detecting displacement (U.S. Patent No. 7319526). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7319526

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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