The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2008

Filed:

Dec. 20, 2005
Applicants:

Tomotaka Takahashi, Kawasaki, JP;

Shingo Nihommori, Himeji, JP;

Inventors:

Tomotaka Takahashi, Kawasaki, JP;

Shingo Nihommori, Himeji, JP;

Assignee:

Mitutoyo Corporation, Kawasaki-shi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/02 (2006.01); G01D 5/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

The displacement detector includes: a light source; a beam splitterfor dividing the light, which is sent from the light source, into two beams of light; reflection mirrorsprovided for the two beams of light sent from the beam splitter, for reflecting these two beams of light and making them incident upon a scale; and corner cubesprovided for the beams of diffracted light, which are generated when two beams of light incident upon the scaleare diffracted by the diffraction grating, wherein the corner cubesretroreflect the diffracted light and make the light incident upon the scale as retroreflected light. The incident angle to grating groove formed between the incident light and the normal line vector of the scale is larger than the diffraction angle formed between the retroreflected light and the normal line vector of the scale.


Find Patent Forward Citations

Loading…