The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2026

Filed:

May. 17, 2021
Applicant:

Mitutoyo Corporation, Kanagawa, JP;

Inventors:

Ryusuke Kato, Ibaraki, JP;

Tomotaka Takahashi, Ibaraki, JP;

Assignee:

Mitutoyo Corporation, Kanagawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 17/32 (2020.01); G01B 11/00 (2006.01); G01B 11/02 (2006.01); G01S 7/481 (2006.01); G01S 7/4912 (2020.01); G01S 17/34 (2020.01);
U.S. Cl.
CPC ...
G01S 17/32 (2013.01); G01B 11/00 (2013.01); G01S 7/4814 (2013.01); G01S 7/4917 (2013.01); G01S 17/34 (2020.01); G01B 11/02 (2013.01);
Abstract

A measurement apparatus includes a laser apparatus, a branching part that splits a laser beam into reference light and measurement light, a condensing part that condenses the measurement light onto an object to be measured, a control part that adjust a focal position where the condensing part condenses the measurement light, and a distance calculation part that calculates distance to the object to be measured on the basis of an optical path difference between the reference light and the measurement light, wherein the condensing part includes a first lens and a correspondence calculation part that calculates a correspondence between a focal position of the condensing part and a position of the first lens on the basis of a position of the first lens and a distance to the object to be measured.


Find Patent Forward Citations

Kato, Ryusuke. (2026). Measurement apparatus and measurement method (U.S. Patent No. 12571915). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12571915

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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