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For the Inventor, By the Inventor

Tokyo, Japan

Takeyoshi Ohashi

This inventor holds 21 USPTO granted patents and 3 published patent applications, primarily in Charged Particle Beams. Top assignees: Hitachi-High-Technologies Corporation, Hitachi High-Tech Corporation. Active years: 2014-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takeyoshi Ohashi. Retrieved from https://idiyas.com/inventor/takeyoshi-ohashi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 21 

% Patents Active = 81.0

Average Co-Inventor Count = 4.4

ph-index = 2

Forward Citations = 22(Granted Patents)


Location History:

  • Tachikawa, JP (2015)
  • Tokyo, JP (2014 - 2024)

Company Filing History:

goldMedal15 out of 2,874 
 
Hitachi-High-Technologies Corporation
 patents
silverMedal6 out of 1,398 
 
Hitachi High-Tech Corporation
 patents

Years Active: 2014-2026

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Areas of Expertise:
Charged Particle Beam
Electron Microscope
Image Processing
Aberration Correction
Scanning Electron Microscope
Inspection System
Measurement Method
Data Processing
Pattern Evaluation
Charged Particle Instrument
Electron Beam Equipment
Focus Adjustment
21 patents (USPTO):Explore Patents
1. 12719013 - Charged particle beam apparatus (2026-08-25),
2. 12068128 - Charged particle beam system (2024-08-20),
3. 11670479 - Electron microscope and method of adjusting focus of electron microscope (2023-06-06),
4. 11430106 - Image processing device, image processing method and charged particle microscope (2022-08-30),
5. 11276554 - Scanning electron microscope and method for measuring pattern (2022-03-15),
6. 10943762 - Inspection system, image processing device and inspection method (2021-03-09),
7. 10727024 - Charged particle beam device and aberration correction method for charged particle beam device (2020-07-28),
8. 10446361 - Aberration correction method, aberration correction system, and charged particle beam apparatus (2019-10-15),
9. 10134558 - Scanning electron microscope (2018-11-20),
10. 9830524 - Method for estimating shape before shrink and CD-SEM apparatus (2017-11-28),
11. 9543053 - Electron beam equipment (2017-01-10),
12. 9536170 - Measurement method, image processing device, and charged particle beam apparatus (2017-01-03),
13. 9443695 - Charged-particle beam device (2016-09-13),
14. 9305744 - Measuring method, data processing apparatus and electron microscope using same (2016-04-05),
15. 9287084 - Aberration corrector and charged particle beam apparatus using the same (2016-03-15),

Title: Takeyoshi Ohashi - Pioneering Inventor from Tokyo

Introduction: Takeyoshi Ohashi is a renowned inventor hailing from Tokyo, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Takeyoshi Ohashi holds several patents in the areas of robotics, artificial intelligence, and renewable energy, showcasing his versatility and forward-thinking approach to invention.

Career Highlights: With a career spanning over two decades, Ohashi has worked with leading tech companies in Japan, spearheading projects that have revolutionized industries and improved the quality of life for many.

Collaborations: Throughout his career, Takeyoshi Ohashi has collaborated with top researchers, engineers, and scientists both in Japan and internationally, fostering a culture of innovation and knowledge-sharing.

Conclusion: Takeyoshi Ohashi's dedication to pushing the boundaries of technology and his passion for creating solutions to complex problems make him a true visionary in the world of invention.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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