Takeo Ushiki

This inventor holds 17 USPTO granted patents, primarily in Semiconductor Testing. Top assignees: Fab Solutions, Inc., Topcon Corporation. Active years: 2003-2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takeo Ushiki. Retrieved from https://idiyas.com/inventor/takeo-ushiki

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

USPTO Granted Patents = 17

% Patents Active = 29.4

Average Co-Inventor Count = 3.7

ph-index = 8

Forward Citations = 249(Granted Patents)

Location History:

Kanagawa, JP (2004 - 2006)
Tokyo, JP (2003 - 2010)

Company Filing History:

Years Active: 2003-2010

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Areas of Expertise:

Surface Contamination Analyzer

Semiconductor Device Tester

Film Thickness Measurement

Production Management System

Semiconductor Manufacturing

Device Inspection

Thickness Measuring Apparatus

Fabrication Process

17 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 7795593 - Surface contamination analyzer for semiconductor wafers (2010-09-14),

2. 7700380 - Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device (2010-04-20),

3. 7385195 - Semiconductor device tester (2008-06-10),

4. 7321805 - Production managing system of semiconductor device (2008-01-22),

5. 7002361 - Film thickness measuring apparatus and a method for measuring a thickness of a film (2006-02-21),

6. 6975125 - Semiconductor device tester (2005-12-13),

7. 6946857 - Semiconductor device tester (2005-09-20),

8. 6943043 - Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device (2005-09-13),

9. 6850079 - Film thickness measuring apparatus and a method for measuring a thickness of a film (2005-02-01),

10. 6842663 - Production managing system of semiconductor device (2005-01-11),

11. 6837936 - Semiconductor manufacturing device (2005-01-04),

12. 6768324 - Semiconductor device tester which measures information related to a structure of a sample in a depth direction (2004-07-27),

13. 6753194 - Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device (2004-06-22),

14. 6711453 - Production managing system of semiconductor device (2004-03-23),

15. 6683308 - Method and apparatus for measuring thickness of thin film (2004-01-27),

Title: Takeo Ushiki: Innovator in Semiconductor Technology

Introduction

Takeo Ushiki is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of semiconductor technology, holding a total of 17 patents. His innovative work focuses on analyzing surface contamination in semiconductor wafers, which is crucial for the manufacturing of high-quality electronic devices.

Latest Patents

Among his latest patents is a surface contamination analyzer for semiconductor wafers. This invention utilizes an electron beam to radiate the semiconductor wafer, causing inelastic scattering in a narrow region. The current that flows from this region is dependent on the substances present, allowing analysts to evaluate the degree of contamination based on the specified substances. Another notable patent is a method used in conjunction with the surface contamination analyzer, which also aids in the fabrication of semiconductor devices.

Career Highlights

Takeo Ushiki has worked with several notable companies throughout his career, including Fab Solutions, Inc. and Topcon Corporation. His experience in these organizations has allowed him to refine his expertise in semiconductor technology and contribute to advancements in the field.

Collaborations

Throughout his career, Ushiki has collaborated with talented individuals such as Keizo Yamada and Tohru Tsujide. These collaborations have further enriched his work and led to innovative solutions in semiconductor analysis.

Conclusion

Takeo Ushiki's contributions to semiconductor technology through his patents and collaborations highlight his role as a key innovator in the industry. His work continues to influence the development of advanced electronic devices.

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]