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Forward Citations = 286

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7 inventors (with patents filed for the assignee):

Keizo Yamada (24 out of 53 patents)

Takeo Ushiki (14 out of 17 patents)

Yousuke Itagaki (11 out of 14 patents)

4. Tohru Tsujide (10 out of 23 patents)

5. Yohsuke Itagaki (2 out of 4 patents)

6. Yosuke Itagaki (1 out of 1 patent)

7. Tohoru Tsujide (1 out of 1 patent)

24 patents: Sort by Forward Citations

1. 7321805 - Production managing system of semiconductor device (2008-01-22),

2. 7232994 - Contact hole standard test device, method of forming the same, method of testing contact hole, method and apparatus for measuring a thickness of a film, and method of testing a wafer (2007-06-19),

3. 7049834 - Semiconductor device test method and semiconductor device tester (2006-05-23),

4. 7002361 - Film thickness measuring apparatus and a method for measuring a thickness of a film (2006-02-21),

5. 6982418 - Contact hole standard test device, method of forming the same, method of testing contact hole, method and apparatus for measuring a thickness of a film, and method of testing a wafer (2006-01-03),

6. 6975125 - Semiconductor device tester (2005-12-13),

7. 6967327 - Contact hole standard test device, method of forming the same, method testing contact hole, method and apparatus for measuring a thickness of a film, and method of testing a wafer (2005-11-22),

8. 6946857 - Semiconductor device tester (2005-09-20),

9. 6943043 - Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device (2005-09-13),

10. 6940296 - Contact hole standard test device, method of forming the same, method of testing contact hole, method and apparatus for measuring a thickness of a film, and method of testing a wafer (2005-09-06),

11. 6914444 - Semiconductor device test method and semiconductor device tester (2005-07-05),

12. 6900645 - Semiconductor device test method and semiconductor device tester (2005-05-31),

13. 6897440 - Contact hole standard test device (2005-05-24),

14. 6850079 - Film thickness measuring apparatus and a method for measuring a thickness of a film (2005-02-01),

15. 6842663 - Production managing system of semiconductor device (2005-01-11),

Fab Solutions, Inc. is a leading provider of innovative technological solutions for various industries. We specialize in delivering cutting-edge software and hardware products, along with exceptional support and consultancy services. With a team of highly skilled professionals, we strive to meet our clients' needs and exceed their expectations. Our goal is to help businesses enhance their operations, improve efficiency, and achieve sustainable growth. Visit our website to explore our range of solutions and learn how we can empower your business.

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Company Badge

USPTO Data Jan 1 1976 - Dec 23 2025

24 Patents

#80 in Kanagawa

#2,580 in Japan

#25,842 in the World

Kanagawa, Japan

Fab Solutions, Inc.