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Keizo Yamada

USPTO Granted Patents = 53

EPO Patents = 2 (Patent Applications = 1)

Average Co-Inventor Count = 1.8

ph-index = 12

Forward Citations = 809(Granted Patents)

Forward Citations (Not Self Cited) = 775(Dec 10, 2025)

Inventors with similar research interests:

Location History:

Osato-gun, JP (2002)
Kanagawa, JP (2004 - 2006)
Honjyo, JP (2011)
Saitama, JP (2013)
Tokyo, JP (1992 - 2019)

Company Filing History:

Fab Solutions, Inc.

19 out of 35,705

Nec Corporation

Topcon Corporation

4. 4 out of 102

Shin-kobe Electric Machinery Co., Ltd.

5. 1 out of 1,641

Hitachi Chemical Company, Ltd.

Years Active: 1992-2019

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Areas of Expertise:

Battery Systems

Direct-Current Power Sources

Surface Contamination Analyzers

Semiconductor Device Testing

Film Thickness Measurement

Production Management Systems

Semiconductor Manufacturing Devices

Cold Cathode Technology

Electron Beam Radiators

Power Supply Systems

Semiconductor Acceleration Sensors

Image Display Devices

53 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 10461545 - Battery system (2019-10-29),

2. 8581557 - Direct-current power source apparatus (2013-11-12),

3. 8036839 - Battery state determining apparatus (2011-10-11),

4. 7795593 - Surface contamination analyzer for semiconductor wafers (2010-09-14),

5. 7700380 - Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device (2010-04-20),

6. 7649341 - Storage battery unit (2010-01-19),

7. 7550982 - Semiconductor device test method for comparing a first area with a second area (2009-06-23),

8. 7420379 - Semiconductor device test method and semiconductor device tester (2008-09-02),

9. 7385195 - Semiconductor device tester (2008-06-10),

10. 7321805 - Production managing system of semiconductor device (2008-01-22),

11. 7232994 - Contact hole standard test device, method of forming the same, method of testing contact hole, method and apparatus for measuring a thickness of a film, and method of testing a wafer (2007-06-19),

12. 7049834 - Semiconductor device test method and semiconductor device tester (2006-05-23),

13. 7002361 - Film thickness measuring apparatus and a method for measuring a thickness of a film (2006-02-21),

14. 6982418 - Contact hole standard test device, method of forming the same, method of testing contact hole, method and apparatus for measuring a thickness of a film, and method of testing a wafer (2006-01-03),

15. 6975125 - Semiconductor device tester (2005-12-13),

Title: Keizo Yamada: Pioneering Inventor from Tokyo

Introduction: Keizo Yamada is a renowned inventor hailing from Tokyo, Japan, known for his groundbreaking contributions to various technological fields.

Latest Patents: Keizo Yamada holds several patents in the areas of robotics, artificial intelligence, and renewable energy, showcasing his innovative mindset and forward-thinking approach.

Career Highlights: With over two decades of experience in the tech industry, Keizo Yamada has worked for leading companies in Japan, spearheading research and development projects that have led to significant advancements in the field.

Collaborations: Throughout his career, Keizo Yamada has collaborated with top researchers, engineers, and scientists from around the world, fostering a culture of innovation and knowledge-sharing.

Conclusion: Keizo Yamada's passion for innovation and his relentless pursuit of excellence continue to inspire the next generation of inventors and shape the future of technology.

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